1
| "Optical and Electrical Characterization of Stable p-type ZnO
thin films obtained by Bismuth Doping." | Journal of Nanoscience and Nanotechnology (2017).
Accepted) (I.F.- 1.483)
|
2
| "Fabrication and Characterization of Cu
Doped ZnO/Bi Doped ZnO Nanolaminates as Mirror for Application in Optical
Devices." | IEEE Transactions on Nanotechnology 16, no. 2 (2017): 203-208.. (I.F.- 1.702)
|
3
| "Fabrication and
characterization of Pd/Cu doped ZnO/Si and Ni/Cu doped ZnO/Si Schottky Diode, | Thin
Solid Film Vol. 612, 259–266 (2016). (I.F.- 1.761)
|
4
| "Fabrication and Characterization of Au/p-ZnO
Schottky Contacts." | Superlattices and Microstructures,vol.85, 697 (2015).(I.F.- 2.117)
|
5
| "Influence of Bi concentration on structural and optical
properties of Bi doped p-type ZnO thin films prepared by sol–gel method." | Journal of
Materials Science: Materials in Electronics: 27(3), 2360-2366.(2016).(I.F.- 1.798)
|
6
| "Refractive Index and Dielectric
Constant Evaluation of Bi doped p -ZnO Thin Film Deposited by Sol gel Method". |
Journal of Electron Devices Vol. 23, No. 1, 1917-1921 (2016).
|
7
| "Work Function Estimation Of Bismuth
Doped ZnO Thin Film". | Advanced Nanoscience and Technology: An International Journal
(ANTJ), Vol. 2, No.2/3, (2016).
|
8
| "Determination of optical parameters of p-ZnO thin film
obtained by Bi doping". | In Annual IEEE India Conference (INDICON) (pp. 1-4). IEEE (2015).
|
9
| “Determination of optical
properties of copper doped ZnO thin film Contacts." | Etmn 2015 –AIP proceddings.
|
10
| "Short channel effects
(SCEs) characterization of underlaped dual-K spacer in dual-metal gate FinFET device." |
In Control, Computing, Communication and Materials (ICCCCM), 2016 International
Conference on, pp. 1-6. IEEE, 2016.
|
11
| "Analytical Modeling and
Simulation of Surface Potential of Short Channel Double Halo Strained-Si (DHS)-DG
MOSFET " | ICCCCM (2016).
|
12
| " Fabrication and Characterization
of Thin-film Heterojunction Diodes for Smart Systems" | In Emerging Devices and Smart Systems
(ICEDSS), 2017 Conference on (pp. 180-183). IEEE
|